DEI has dedicated to build a full product line from design to test in the past years so that we could provide customers true one stop test related solutions. Based on the application of these technology and products,we could help our customers satisfy the requirements in the following fields:

• Test Pattern Conversion & Verification

We could help customers convert the EDA output patterns with the format of VCD,EVCD,WGL,STIL,TDL to ATE platforms such as Teradyne,Verigy, Credence, Advantest etc. Also we could help customers check the consistencybetween the debugged ATE test patterns and the original EDA simulation patterns.

• Presilicon Debug

We could make use of virtual tester to help customers check any potential problems for thoese EDA simulation patternssuch as tester incompatible tests, problematic conversion from EDA to ATE before the engineering sampling has arrived. In this way, the customers will be able to identify shortcomings in the chip design and defects in the DUT test program early in the design cycle where it can be remedied easily and with minimum expense.

• Test Program Conversion

We could help customers convert the digital part program and test patterns from one tester platform to another in less than 1 hour.

• Test Time Reduction

Based on our on-board current test monitors, we could help customers achieve the goal of reducing the total current test time, for examIDDQ, from 1 second to 0.1 second.

• Quality Improvement to 0 DPM

With cost effective implementation for current testing such as IDDQ,IDDT,analog IDD, the overall defect coverage of the whole test solution could be increased significantly and the final DPM level of the chip could be guaranteed to hundreds or even below.

• Test Insight(link)

Test Insight is an intelligent software house located in Israel developing solutions for design and test closed loop, and leads the standard in software tools of ATE industry. Their website are http://www.testinsight.com.

• WaveWizard Family
  Please copy this attachement WaveWizard_brochure.pdf

• STILlink Family
  Please copy this attachement STILink_brochure.pdf

For more information regarding these products, please feel free to contact 021-50802565 or email bob_ren@deiltd.com for details.

• QStar(link)

Qstar Test is a current testing company located in Belgium and provides customers solutions for:

�Test Time Reduction
�IC Quality Improvement to 0 DPM
�IC Reliability Improvement

based on their patented current monitors which are ATE independent. Their website are http://www.qstar.be. Their main products are:

�LoadBoard Monitor Modules
QD10XX(HC), QT14XX,QA10XX

�ATE Monitor Modules
Supply Current Monitors

�Built-in Current Monitors
BICMON, T-MON, PG-MON

Current test solution is quite a cost effective methodology to improve the overall fault coverage significantly without incurring significant test development cost. However due to the long tes time on ATE to measure current,customers are hard to achieve the balance of cost and quality. Fortunately based on the innovative high-speed, high-accuracy ATE independent supply current measurement modules from QStar, we could reduce the overall IDDX test time dramatically and thus achieve a better outcoming chip quality.

Summary of data from Peter C. Maxwell of Agilent Technologies, “Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings�in IEEE Design & Test of Computers, 2003

The package and application of the Module